Dynatronix - Manufacturing Pulse and DC Electroplating Power Supplies for the Metal Finishing Industry
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Pulse Periodic Reverse Copper Plating of High Aspect Ratio Holes
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  By  K.J. Whitlaw,  LeaRonal, Buxton Derbyshire UK

Abstract
The use of pulse periodic reverse current for improving the metal distribution of copper on high aspect ratio printed circuit boards will to measure.  Data will be presented comparing tests carried out using both direct current and pulse periodic reversal to measure the effect of current density on metal distribution for high aspect ratio printed circuit boards (e.g. 8:1).  A theoretical basis for the improvement obtained by using pulse periodic reversal will also be presented.  The stability of the electrolyte under pulse periodic reversal conditions will be investigated.  Details will also be given concerning the power supply/current switching unit requirements.
 

Introduction 

Over the last 10 years the complexity of printed circuit board design has increased dramatically, the board thickness has increased significantly and hole diameters reduced significantly compared to the relatively simple boards which were produced during the early 1980s.  Aspect ratios (board thickness divided by hole diameter) of 10 to 20:1 or even greater are now commonplace.  High aspect ratio boards present particular problems for electrolytic copper plating since with traditional direct current techniques, unless very low current densities are used, it is impossible to obtain uniform coatings with even thickness on both the surface of the board and in the through-hole.  Operation at low current density is not compatible with today's industry needs for high production output.  The use of pulse periodic reversal is proposed as a means of achieving the desired uniformity of metal distribution at sufficiently high current densities to maximize productivity.

 

 

Theoretical Considerations 

The simplest way of considering an electrolytic plating system is by considering the anode and cathode as capacitors with resistors in parallel connected via solution bulk resistance.  This is shown schematically in Figure 1.  The uniformity of current distribution is dependent upon the uniformity of the potential distribution, which in turn is dependent on the potential drop due to the ohmic resistance of the solution.  The key to uniformity of secondary current distribution (non-geometric) is polarization resistance.  If we consider 2 points on a printed circuit board, Ps being on the surface and Ph being in the hole, then the ratio of the current density on the surface to the hole (Js/Jh) is given by the following:

 

Js/Jh = (Rh + Rp)/(Rs +Rp)  - (1)  This is shown diagrammatically in Figure 2. 
 

The greater the polarization resistance the more even the metal distribution, this can be demonstrated by substituting simple numbers into equation (1).  For example: 
 

If Rh = 6, Rs = 1 and Rp = 0 then Js/Jh = 6/1=6.  

If Rp = 1 then Js/Jh = (6+1)/(1+1) = 7/2 = 3.5.  

If Rp = 4, Js/Jp = (6+4)/(`1+4) = 10/5=2. 
 

Polarization curves showing variation in current with potential are used to describe the behavior of an electrochemical system.  A typical curve is described in Figure 3.  It is generally accepted that the reaction Cu2+ + 2e-  Cu takes place in two steps, each involving a 1 electron exchange with the cuprous ion as an intermediate.  

Cu2+ + e- Cu+
Cu+ + e- Cu
 

The first step is rate determining and controls the overall kinetics. 
 

In electrolytic copper plating for printed circuit boards the range where i/iL = 0.2 - 0.4 is most important, ie region 3 of Figure 3.    This is known as the Tafel region.  The important characteristic for uniformity of current distribution is the slope of the polarization curve and this is dependent on the charge transfer co-efficient. 
 

Figure 4 shows three polarization curves where has values of 1, 0.5 and 0.25.  In order to determine the Tafel slope of these curves, it is necessary to compensate for the transport contribution to the current and plot the log of the current density versus applied potential.  This is depicted in Figure 5, where Tafel slopes of 60, 120 and 240 mV per decade are obtained for values of 1, 0.5 and 0.25 respectively.  In pulse periodic reverse plating, Tafel slopes as high as 500 mV per decade are not uncommon and differences between the Tafel plots using direct and pulse periodic reverse current are shown in Figure 6.  
 

So what are the practical implications of this for uniformity of copper electrodeposition on through hole printed circuit boards?  Considering the diagram of Figure 2, assuming that the over potential at Ps is 250 mV and the over potential at Ph is 150 mV, then using Figure 6 the current density at Ps in the case of DC is 3.98 amps/dm2 whereas in the case of pulse periodic reverse Ps  is 2.81 amp/dm2 and Ph is 1.78 amp/dm2.  This results in a surface to hole ratio in the case of direct current of 6.3:1 and pulse periodic reverse current of 1.58:1. 
 

The increase in polarization resistance (reduction of transfer coefficient or increase of Tafel slope) is postulated to be due to the adsorption of an insulating film containing the long chain organic carrier component of the electrolytic copper additive system. copper (I) and chloride.  This is depicted in Figure 7.  The degree of absorption of this species is reduced as applied potential increases, as is shown in Figure 8.  A high degree of surface coverage results in lower charge transfer co-efficient.  It is therefore proposed that the absorption of this material is enhanced by the strong positive potential during the anodic phase of the pulse reverse cycle. 
 

There are two other aspects which need to be considered from a mechanistic standpoint.  Firstly, if the organic suppressing agent is added to the bath without chloride, no suppression results, adding weight to the theory that the absorbing compound contains chloride and organic carrier.  Secondly, the addition of a sulphur based additive to the system causes acceleration in DC mode, which is overcome by the application of the pulse reverse technique, indicating desorption of this species during the anodic phase.  All these mechanisms are in agreement with those already reported. 
 

The Wagner number is a dimensionless quantity which is an electrochemical value used to define uniformity of current distribution.  The use of pulse current electrodeposition for enhancing Wagner  numbers has been previously reported.  The Wagner number is calculated as follows: 
 

Wa = d/dj x k/L = Ra/Re  

ie this is charge transfer resistance divided by the ohmic resistance.
d/dj = (2.303RT/Zf)/j
 

k = solution conductivity 

L = characteristic length
 

For high aspect ratio holes the characteristic length is the length of the hole (thickness of the board) squared divided by the hole diameter.  This characteristic length results from a mathematical analysis of a plated through hole system which is very similar to that of a tubular electrode where the ratio of ohmic resistance to charge transfer resistance is given by  
 

                    k = (4zFl2/RTd)io where l = length of hole, d = diameter of hole 
 

It can be seen from the above that increasing the charge transfer resistance, increasing the temperature of solution or conductivity (reducing the ohmic resistance), reducing the current density all tend to make the current distribution more uniform.  Increasing the thickness of the board or reducing the diameter of the hole make the current distribution less uniform and since the thickness of the board is a squared term its effect is more pronounced. 
 

Figure 9 shows the variation of Wagner number with applied current density for values of 0.12 and 0.5 and L values of 1.92 cm and 4.17 cm.  More uniform distribution is obtained when = 0.12 compared to 0.5 (NB this is the most pronounced effect) and at each value more uniform distribution is obtained at the lower L value as predicted by the above equations. 


 

Practical Considerations 

A standard test board of 8:1 aspect ratio (0.3 mm diameter holes drilled in 2.4 mm thick laminate) was plated in a specifically developed acid copper electrolyte and the effect of average applied current density on metal distribution was measured for both direct current and pulse periodic reverse.  Surface to hole ratio was determined by standard micro section technique and typical pulse periodic reverse waveform is shown in Figure 10.  The results are given in Table 1 and expressed graphically in Figure 11.  It can be clearly seen that with direct current the metal distribution deteriorates as the average current density is increased, whilst the surface to hole ratio is maintained close to 1 with pulse periodic reverse irrespective of the applied current density.  Photomicrographs of the actual boards are shown in Figure 12.
 
Table 1 - Comparison of pulse periodic reverse and direct current

Ratio board surface: hole centre 

Hole diameter        0.3 mm 

Board thickness    2.4 mm
 
 
Average current density  PPR * DC
1.6 amp/dm2 1.14:1 1.34:1
2.6 amp/dm2 0.90:1 1.49:1
3.6 amp/dm2 1.05:1 2.08:1
 
* Reverse current 0.4 amp/dm2 (mean)
10 msec forward, 0.5 msec reverse
 

Many types of difficult boards have now been successfully processed in full scale production, boards which proved very difficult to plate using traditional DC techniques.  Two typical examples will now be considered. 
 

1.  0.3 mm diameter hole in 3.2 mm thick laminate 

2.  0.4/1 mm diameter holes in 5 mm thick laminate
 

The following pulse conditions were used for each type of board:  

 
peak forward current density   4 amp/dm2
Forward: reverse ratio   3.67:1
Forward time:  reverse time  20 msec: 1 msec
Plating time  1 hour
 

The thickness values obtained are shown in Table 2.  A typical photomicrograph of the 1 mm hole in the 5 mm board is shown in Figure 13.  The 3.2 mm board was a British Standard test panel and the 5 mm board had large ground plane areas (holes in low current density regions) and isolated areas (holes in high current density regions) making it extremely difficult to process.  Much more uniform distribution is obtained using the pulse periodic reverse technique. 


 

Solution Stability 

During the development of the process for use with pulse periodic reverse, additives generally tended to fall into two categories.  One which resulted in an enhancement of metal distribution but unfortunately was unstable in the solution or secondly those which were stable towards the high current density reverse pulse but did not produce the desired improvement in metal distribution.  A new generation of additives has been developed which are both stable in the solution and produce the required metal distribution characteristics.  This solution stability can be demonstrated by continuous electrolysis tests under laboratory conditions.  This was carried out in a 3 litre beaker at a current of 0.33 am/litre with the additive concentrations being maintained by addition after analysis using cyclic voltammetric stripping techniques.  The variation in additive consumption with electrolysis time is shown in Figure 14.
 
Table 2 Overall Averages Computed from all the Holes Sectioned for Each Board
Hole diameter Board thickness 12/d Surface Hole entry Hole centre a:b a:c b:c Typical DC result at 3 A/dm2a:c
mm mm mm (a) (b) (c)        
0.4 5.0 62.5 33.2 42.3 22.3 0.78 1.49 1.89 7.0
1.0 5.0 25.0 27.0 34.0 31.4 0.79 1.16 1.08 2.4
0.3 3.2 34.1 34.3 43.2 26.1 0.79 1.31 1.65 3.0
 
3.2mm board - 3 sections taken from 18 x 12"panel
5.0 mm board - 14 sections taken from 18 x 24" panel,
2 holes measured per section
 
Average surface = 1+ 2+3+4
                               4
 
Average hole entry = 5+ 6+ 8+10
                                    4
 
Average hole centre = 7 + 8 
                                     2
 

This low rate of replenishment and the stability of the solution have been confirmed by production operation. 
 

Recommended Operating Conditions  

The recommended solution composition is shown in Table 3.  As mentioned above, the additive and carrier components can be determined by CVS and combined into a replenisher solution for convenience of dosing.
 
Table 3 Copper Gleam PPR
 
Operating Conditions
Copper sulphate 75 g/l
Sulphuric acid 120 ml/l
Chloride 50 ppm
Temperature 25°C
Copper Gleam PPR Carrier 15 ml/l
Copper Gleam PPR Additive 0.5 ml/l
Replenishment (10,000 ampere hours)
Copper Gleam PPR Replenisher 2.5 litres
 

Deposit Properties         

The deposits obtained from the Copper Gleam PPR process are comparable with the deposits obtained from the highest performance DC electrolyte.  Elongation is approximately 20% and ultimate tensile strength 300 N/mm2. Deposits are fine grained equiaxed and matt in appearance and will withstand the most rigorous thermal shock testing without cracking, eg IPC, BS 9760.  These characteristics are maintained throughout the lifetime of the electrolyte.

 

 

Additional Benefits 

Since pulse periodic reverse tends to equalize potentials across a surface where in DC strong differences in potentials exist, pulse periodic reverse produces more uniform surface distribution in pattern plated boards with unfavorable geometries and reduces overplating of isolated tracks.  This can significantly reduce the quantity of solder mask required to cover these tracks with the attendant cost savings.
On a specific test board with isolated tracks in high CD areas and other tracks in low CD areas, using DC plating a thickness ratio of 2.3:1 was achieved whereas with pulse periodic reverse this was reduced to 1.2:1.  Using a base copper thickness of 17 microns, this gives rise to the following track heights. 

1.  DC    Low CD region 17 + 25 = 42 microns 

               High CD region 17 + 58 = 75 microns
 

2.  Pulse periodic reverse 

            Low CD regions 17 + 25 = 42 microns
            High CD regions 17 + 30 = 47 microns
 

To cover a 75 micron track requires a dry solder mask film coating of 50 microns, which is equivalent to a wet film weight of ca. 105 g/m2 .  For a 45 to 50 micron track a dry film thickness of 40 microns is required, equivalent to 90 g/m2.  Therefore when using pulse plating a solder mask saving of (105 - 90)/90 = 16.7% is achievable.  This is demonstrated diagrammatically in Figure 15. 
 

Also as a result of the improved metal distribution, both surface to hole and across the surface, significant copper metal savings can also be achieved by using pulse periodic reverse e.g. for a board with a surface hole ration of 1.40: 1 then to achieve a thickness of 25 µm in the hole an average surface thickness of 35 µm is required.  If by use of pulse periodic reverse plating a 1:1 surface to hole ratio can be produced i.e. 25 µm on both surface and hole, the resultant savings are (35 - 25)/25 = 40%. 
 

Instrumentation 

For a plating window of say 3 m x 0.6 m and pattern plating with 50% copper exposed, a unit capable of generating a forward current of 400 amps per side and a total reverse current of 2500 amps is required.  It is important that the pulse generating system contains two separate rectifiers, one for the forward current and one for reverse current, since they are of different magnitudes.  A range of water-cooled, switch mode rectifiers which generate this pulsed output incorporating the high energy reverse pulse is now available.
 

Technical Description 

Each system comprises a pulse engine and a separate control unit which sets and controls the pulse output in terms of
 
forward pulse time ( 1 - 50 milliseconds)
reverse pulse time (0.2 - 3 milliseconds)
forward peak current (50 - 800 amps)
reverse peak current (50 - 2500 amps)
 

A single unit linked to its individual control unit can be used as a stand alone system but for larger multiple installations all control units are linked using an RS485 data link.  Pulse timing is then set and controlled from one controller which is configured as the master.  Alternatively, a personal computer or plant computer can control all pulse units in the installation. 
 

The forward and reverse current densities are preset by the operator or process engineer  and the reverse current is automatically calculated and set by the control unit.  The equations for calculating the currents are as follows: 
 

a = average current density 

b = peak forward current density
c = peak reverse current density
d = forward plating time
e = reverse plating time
f = ratio of peak reverse current density:  peak forward current density
 

i)  To calculate average current density from known peak current densities and plating time: 

                    a = [(b x d) - (c x e)]/(d + e)            -1 
 

ii)  To calculate forward and reverse peak current densities from known average current density peak reverse:  peak forward and plating time: 

                c = f x b substitute in (i)                                                 -2 

                a = [(b + d) - (f x b x e)]/(d + e) rearranging             -3
                b = (d - f x e)/a(d + e) from (2)                                     -4
                c = f x b
 

The pulse engines should be situated as near as possible to the actual plating tank to minimize inductance effects and the units can be configured to provide either single anode or dual anode capabilities.  If the system is configured for local control and not computer control, all the pulse parameters and plating current may be entered using the keypad and display. 


 

Conclusions 

1.  Pulse periodic reverse current can be used to give improved metal distribution of copper on high aspect ratio printed circuit boards when compared to direct current plating.  This improved distribution can be achieved at high plating rates.  There is no need to reduce current density for difficult boards to achieve good surface to hole ratios.  When using pulse periodic reverse with pattern plating build up on isolated tracks is minimized.  This results in increased productivity and lower manufacturing costs.
 

2.  An acid copper electrolyte has been developed for use in combination with pulse period reversal which is capable of delivering the benefits and a reliable pulse plating rectifier is now also available. 
 

3.  The use of this technology will increase in the future as the demand for more complex boards at high production rates increases. 


 

 

References 

1.  M McCormick, DeMontfort University, private communication
2.  M Goodenough, K J Whitlaw, Trans Inst Metal Finishing, 67 (1989), 57 - 62 
3.  A Hubin, D Segers, J Vereeken, unpublished data, part of a LeaRonal/Siemens project 

4.  T Pearson, J K Dennis, Journal of Applied Electrochemistry, 20 (1990), 196- 208 

5.  M R Kalantary, D R Gabe, M R Goodenough, Journal of Applied Electrochemistry 23 (1993), 231 - 240 

6.  T Kessler, R Alkier, Journal of Electrochemical Society 123, (1976), No 7, 990-999 

7.  LeaRonal Copper Gleam PPR 

8.  Chemring Plating Systems

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